What the Coating Line Doesn’t Tell You. Read the article
Industry
Thin films decide how a device feels, looks and lasts.
Devices keep getting thinner and more functional, which puts more of their performance into multilayer films. Haptic films, moisture barriers and flexible substrates can drift in ways that change the finished device, and a single pinhole, particle or scratch can compromise a layer.
Yield is a major driver of cost, yet defects across several thin or transparent layers are hard to find, and functional properties often go unmeasured until destructive or device-level testing.
By then, much of the value has been added, in a market with short launch windows.

PlasmaSens™ can connect film measurements to device performance earlier. One non-contact scan, with no sample preparation, is able to report properties and defects at the same locations and compare a film with a known-good reference, while the material continues through its process. Materials within reach include functional films, barrier films, flexible substrates and multilayer structures.
Further properties are available based on your process needs, using models calibrated on your own reference measurements.
That lets teams act on a film before assembly adds cost, tighten the loop with material suppliers, and get more good output from the film they already make.
Measuring how film properties vary helps teams hold functional films within the specs their devices depend on.
Drift and defects can be found before a film moves on to assembly.
Shared material data gives makers and suppliers a common basis for resolving variation.
Earlier evidence can shorten qualification during short product launch windows.
The fastest way to evaluate PlasmaSens™ is with your own material. Book a demo scan, or send us samples and we will return a report.