What the Coating Line Doesn’t Tell You. Read the article

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The PlasmaSens™ Platform

The PlasmaSens™ platform uses cold atmospheric plasma and physics-informed machine learning to read the microstructure, properties and defects of materials non-destructively, in one scan. The same core technology comes in three physical implementations, from at-line to inline.

PlasmaSmart™

The Physics-Informed Intelligence Behind Every Scan.

Every PlasmaSens system is backed by PlasmaSmart, physics-informed software for materials characterization built on SirenOpt’s proprietary cold atmospheric plasma technology. It combines plasma physics with machine learning to turn raw signals into answers you can act on.

Photo of a polymer film next to a PlasmaSens map of the same film, with a wrinkle visible as a dark vertical line.
See how structure and properties vary across a surface.

PlasmaSmart extracts about 9,000 physics-based features from each scan, and each one can be shown as a spatial map. Different maps reveal different things: defects, property variations or subtle changes in microstructure. Here, a wrinkle in a polymer film that cannot be seen by eye appears as a clear line on one of the signal maps.

Example from an electrode sample: five properties from the same scan (tensile strength, mass loading, porosity, sheet resistance and volume resistivity) plotted along the same positions.
Illustrative data
Quantify several properties that matter from a single scan.

Each scan records optical, thermal and electrical signals at every point, and the same data is used to measure several properties at once. Every value comes from the same location, so when one property changes, you can see how the others move at that position.

Optical emission spectra of clean and contaminated battery electrode material, with insets showing how iron, copper and aluminum each change four emission peaks.
Find and locate contaminants, cracks, voids and debonding, at the surface and below it.

Defects and contaminants change how the plasma interacts with the material. That change shows up in the plasma’s optical emission. Each contaminant shows a unique signature that can be detected and, once calibrated, identified. Here, copper, iron and aluminum show distinct signatures compared to the uncontaminated NMC cathode.

Scatter plot of three samples. Samples 2 and 3 overlap on the right; Sample 1 forms a separate group on the left.
Illustrative data
Compare every scan with your own known-good reference.

Three samples from the same process show differences in their interaction with plasma. A low-dimensional representation of the plasma-material interactions reveals that Sample 1 is measurably different from Samples 2 and 3.

Histograms of a property for Batch C and Batch D, with Batch D spread wider, next to a spatial map of each batch.
Link scan data to how material performs later, to sort or bin material before it moves on.

Two batches with the same average for Property X but a different spread. The maps show that Batch D varies more than Batch C, and where. If the quality requirement calls for a tight distribution, Batch D can be flagged for inspection before it is used.